
- High Sensitivity & Low Noise
- Fast, Reliable Data Capture
- UV-VIS and NIR Optimized Options Available

- Versatile Sampling for Diffuse/Specular Reflectance, Backscatter & Fluorescence
- VIS–NIR (400–2100nm) and UV–VIS (180–1100nm) Solarization-Resistant Models
- Extreme Solarization-Resistant (XSR) Probe Features Ultra-Low Loss Fiber for Harsh UV Exposure
- Connects Directly with Ocean Optics Spectrometers & Accessories

- Transmission Dip Probes Designed for Reliable In-Solution Absorbance/Transmission Measurements
- Rugged Stainless Steel or PEEK for Tough Process Conditions and Harsh Environments
- Flexible Path Lengths Available with Interchangeable Probe Tips
- Compatible with Ocean Optics Spectrometers and Accessories

- Stable, High-Quality Output Across Broad Wavelength Ranges from 185–2500 nm
- Deuterium-Tungsten, Xenon, Tungsten-Halogen Lamp Types Available
- Fully Compatible with Ocean Optics Spectrometers and Accessories

- Connects Directly with Ocean Optics Spectrometers & Accessories
- Broad Wavelength Coverage: VIS–NIR, SR, and XSR Fibers Optimized for 180–2100 nm
- Solarization-Resistant Fibers Maintain Signal Accuracy Under Harsh UV
- Multiple Jacketing Choices for Durability and Tight Bend Radius Needs

- Measure Total Irradiance or Reflectance with Models Optimized for Emission Sources or Surface Illumination
- Ideal for UV–NIR Applications in Materials Testing, LEDs, Lasers, and More
- White Reflectance Standard Provides Stable, Repeatable Reference Measurements
- Compatible with Ocean Optics Spectrometers and Accessories
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