Measurement Tools | 量測工具
Measuring Tools are used to accurately measure a range of physical features or characteristics of many different optical components for nearly any optical application. Measuring Tools consist of products such as measuring gauges, microrules, or spherometers designed to provide precise, accurate measurement. Measuring Tools allow specific or important features of optical components to be accurately determined with a small number of tools.
Edmund Optics offers a wide range of Measuring Tools suited for many optical measurement needs. Measuring gauges offer precise, easy-to-use measurement capabilities in a range of different sizes or types including calipers or micrometers. Spherometers are extremely specialized measurement tools that determine the surface radii of convex or concave objects. Standards tables are also included for quickly referencing radii information.
單面光學平面反射鏡
TECHSPEC®組件由愛特蒙特光學設計、指定或製造。進一步瞭解
- 直徑尺寸從1/2"到14"
- 每個直徑75mm及以上的λ/20平面反射鏡都帶有校准證書
- 具有標準金屬反射鏡鍍膜:λ/10反射鏡及λ/20反射鏡
精密雙面光學平板
TECHSPEC®組件由愛特蒙特光學設計、指定或製造。進一步瞭解
- 可選λ/10 與λ/20表面平面度
- 各 λ/ 20平面度,76.2mm以上尺寸包含校準證書
- 在接觸式測量應用中有著較長的使用壽命
- 可選用單面光學平面反射鏡
C-Mount Video Coupler for Borescopes / Fiberscopes
- Compatible with C-Mount Cameras
- Designed for 1/2" or Smaller Camera Sensors
- Fits Standard Boroscope/Fiberscope Eyepieces
Foucault Tester — Knife Edge Test
- Test for Wavefront Accuracy
- Comes Completely Assembled
- All Metal Construction
多刻度接觸式刻劃板
- Greater Stability than Film Reticles
- Low Reflection Chrome Pattern
- English or Metric Styles
Circular Scale Contact Reticles
- Greater Stability than Film Reticles
- Low Reflection Chrome Pattern
- Protractor, Crosshair, or Concentric Square Patterns
Linear Scale Contact Reticles
- Greater Stabiliy than Film Reticles
- Low Reflection Chrome Pattern
- English and Metric Styles
Index Square Contact Reticles
- Greater Stability than Film Reticles
- Low Reflection Chrome Pattern
- English or Metric Index Square Scales
Spectralon® 白平衡及漫反射測試板
- 漫反射在紫外線到可見光再到近紅外線波長範圍 (350 – 1600nm) 具備 99% 的標稱反射率
- 耐用、穩定且可清洗
- 具有 NIST 可追蹤校準憑證及資料 (250 – 2500nm)
Deluxe Illuminated Direct Measuring Microscopes
- 40X and 100X Models, Include 10X Eyepiece
- Inch/Metric Reticle
- Rack and Pinion Focusing
or view regional numbers
QUOTE TOOL
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