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4" Sphere, General Purpose Integrating Sphere System

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Stock #58-585 5-7 Days
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NT$80,500
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NT$80,500
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NT$77,000
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下載產品資料
Coating:
Spectraflect®
Mounting Threads:
¼-20
Note:
Included Accessories:
SMA Adapters: #89-652 (x2)
Port Plugs: #89-651 (x1)
Port Frame Reducer: #89-650 (x1)
Port Reducer: #89-648 (x1)
Diameter (inches):
4
Diameter of 0° Port (inches):
1.50
Diameter of Port 2 (inches):
1.00
Diameter of Port 3 (inches):
1.00
Diameter of Port Frame Reducers (inches):
1.00 - 0.50
Diameter of Port Plugs (inches):
1.00
Diameter of Port Reducers (inches):
1.50 - 1.00
Diameter of SMA Adapter (inches):
1.00
Damage Threshold, By Design: Damage threshold for optical components varies by substrate material and coating. Click here to learn more about this specification.
1.7 J/cm2
Thermal Stability:
Up to 160°C

Regulatory Compliance

RoHS 2015:
Reach 209:
Certificate of Conformance:

產品系列說明

  • 非常適用於量測光源
  • 可進行升級以校準傳感器及測試透鏡
  • 專為簡易系統整合而設計

通用積分球系統經過精心設計,能在空間中對輻射通量進行積分,以量測光學輻射。這些球能與傳感器耦合,以建立輻射計、光度計或分光輻射計,進而量測光源發出的總幾何光通量或照明區域的光通量密度。此外,這些球系統可用於量測高功率雷射及雷射二極體的輸出,或量測材料的反射率與穿透率。

A variety of accessories are available for modifying or upgrading the performance of the systems, including port plugs, port reducers, and uniform source lamps. Uniform source lamps are ideal for many irradiance applications, such as characterizing the responsivity, linearity, photo response non-uniformity, and dynamic range of focal-plan arrays. Additionally, these sources can be used for evenly illuminating test targets for evaluating the CTF of optical systems or imaging lenses, and for measuring cosine4 irradiance falloff or other variations in irradiance within optical systems caused by optical aberrations.

 
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